Michal Sofka is an R&D Manager at Siemens Corporation, Corporate Research (SCCT), Princeton, NJ. His research focuses on multiple object detection and segmentation, machine learning for computer vision, and image analysis in the cloud computing environment. He is interested in building robust medical imaging applications of varying scales and complexity.
Prior to SCCT, Michal did his undergraduate work at the Czech Technical University. He received the MS degree in Electrical Engineering from Union College in 2001. He received the MS and PhD degrees in Computer Science from the Rensselaer Polytechnic Institute (RPI) in 2006 and 2008, respectively.